Scattering near-field optical microscopy with ultralow tip oscillation amplitudes. Credit: Takashi Kumagai Understanding the interaction between light and matter at the smallest scales (angstrom scale ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Electron spin resonance (ESR) is a key tool for the spectroscopic characterization of chemicals. It relies on resonantly changing the spin state of electrons (spin is an intrinsic quantum property of ...

Anyone who has ever taken the time to critically examine a walnut knows that a two-dimensional photograph fails in many respects to truly convey the unique features--the nicks, crannies, valleys, and ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Park Systems Corp., the world's leading provider of atomic force microscopy (AFM) solutions, today announced the launch of ...

In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...

New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...

A new AI model generates realistic synthetic microscope images of atoms, providing scientists with reliable training data to accelerate materials research and atomic scale analysis. (Nanowerk ...