As single-chip systems arrive on the scene, their complexity is putting new pressure on the already strained practice of testing and verifying a design. In the past, a circuit on a single chip was ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

As the sophistication of semiconductors continues to grow, so does the need for system-level test (SLT) in production to ensure that high-performance processors, chiplets, and other advanced devices ...

http://www.newfocus.comWith the growing complexity of wavelength-division-multiplexing (WDM) network systems–more channels, narrower channel spacing, and wider ...