Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

A new approach has been uncovered to detail the formation of material defects at the atomic scale and in near-real time, an important step that could assist in engineering better and stronger new ...

Researchers at the Department of Energy’s (DOE) Argonne National Laboratory have discovered a new approach to detail the formation of material changes at the atomic scale and in near-real time, an ...

The promise of smart test is a data-chain problem before it is an algorithm problem. A device can pass every checkpoint and ...

(Nanowerk News) From blacksmiths forging iron to artisans blowing glass, humans have for centuries been changing the properties of materials to build better tools - from iron horseshoes and swords to ...