Not all defects are visible with the same microscope. Explore how resolution, contrast, and signal interpretation shape semiconductor failure investigations.

Using non-destructive imaging methods, a team of scientists has obtained three-dimensional insights into the interior of crystals. They determine important data about line-shaped defects that largely ...

There are several different types of scanning probe microscopes, the most prominent of which are atomic force microscopy (AFM) and scanning tunneling microscopy (STM). There are also many other types, ...

A research group led by Professor Kenneth K.Y. Wong of the Department of Electrical and Electronic Engineering at the University of Hong Kong (HKU), in collaboration with Bielefeld University in ...

There are several different types of electron microscopes, including the transmission electron microscope (TEM), scanning electron microscope (SEM), and reflection electron microscope (REM.) Each of ...

Olympus has introduced the scanR 3.1 high-content screening station. According to the company, the scanR 3.1 embodies the “self-learning microscopy” concept and is capable of quickly gathering data ...