Available in through-hole, surface-mount, and solderless compression-fit mounting styles, the Quick Lock test sockets accommodate QFN/MLF package types. The devices are offered in all grid sizes in ...
A technical paper titled “Fabrication and Characterization of Three-Dimensional Microelectromechanical System Coaxial Socket Device for Semiconductor Package Testing” was published by researchers at ...
Offering improved bandwidth over previous versions, the Center Probe test sockets feature an insertion loss of less than 1 dB in frequencies to 18.5 GHz (less than 3 dB to 39.7 GHz) and a VSWR of less ...
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