SAN DIEGO — After nearly a year in the works, the IC-test consortium backed by Intel Corp. and Advantest Corp. today (June 3) released its first hardware and software specifications to enable an “open ...
The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...
This is a companion article to PXI boosts IC test, which appeared in our July 2011 issue. Companies and universities that have tried to address the challenges of semiconductor test imparted by Moore’s ...
This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...
AUSTIN, Texas--(BUSINESS WIRE)--NIWeek: NI (Nasdaq: NATI), the provider of solutions that enable engineers and scientists to solve the world’s greatest engineering challenges, today announced the NI ...
1. The OSD335x is an example of a complete system fitting into a tiny BGA package. We also discussed the advantages SiP brings to the design and manufacturing of semiconductors and how they can be ...
Keysight Technologies Inc. today announced the M937xA series of one-slot PXI vector network analyzers that cover 300 kHz up to 26.5 GHz. The company also debuted a new PXI Reference Solution for RF ...
NI (Nasdaq: NATI), the provider of solutions that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the NI Semiconductor Test System (STS) series. These ...
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