Konstanz, Germany -- Automated optical inspection (AOI) of wafer-based solar cells requires a combination of 2D and 3D imaging to detect imperfections in coatings and printings, and for the reliable ...

Line-scan vs. area-scan cameras. Key ingredients to the high-speed machine-vision system for inspection. How to synchronize the wafers with the camera. Optical semiconductor inspection presents ...

Since they were introduced a decade ago, CMOS-APS sensors have rapidly become the first choice for high-speed area scan imaging. Up to now, most line scan cameras have been equipped with charged ...

Teledyne DALSA has announced the launch of its new Tetra line scan camera family, designed for various machine vision applications. The Tetra series incorporates advanced multiline CMOS image sensor ...

Emergent Vision Technologies launched a 100 GigE line-scan camera, the Pinnacle TLZ-9KG5. Through its 100 GigE QSFP28 interface, the camera reaches a top single-line rate of 608 kHz. The camera ...

Teledyne DALSA’s Linea™ Lite family of line scan cameras are available to order now. Built for a wide range of machine vision applications, Linea Lite cameras feature a 45% smaller footprint than the ...