Embedded test compression is a standard technique for dramatically reducing the test data volume and test time on the automatic test equipment. Companies typically aim for 60x to 100x compression for ...
To compensate, test engineers use top-up patterns that bypass test compression logic. This restores the test coverage but reduces the compression of the overall pattern set. As a result, the presence ...
The standard approach for testing IC logic is the use of scan chains, with embedded compression as the standard approach for applying scan patterns. Embedded compression enables the same test quality ...
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