Neutron reflectometry is a powerful analytical technique used to study the structure and composition of thin films, multilayers, and interfaces at the nanoscale. It involves directing a beam of ...

The unique properties of neutrons make them unmatched probes for materials science. Although they are particles, they have a wave-like nature, with wavelengths in the same range as X-ray wavelengths, ...

Originally developed for navigation and timing applications, signals from global navigation satellite systems (GNSS) are now commonly used for geophysical remote sensing applications, including ...

Nucleon reflectometry and high-temperature equipment provide a unique combination that allows an atomic-scale understanding of thin-film growth and diffusion processes. This knowledge affects numerous ...

A team of researchers from ANSTO and University of Technology Sydney have set a record by conducting thin film experiments at 1,100 degrees Celsius, using the Spatz reflectometer equipped with a ...

A new technical paper, “Characterisation of Complex Multilayer Nanostructures with High Aspect Ratio,” was recent published by researchers at Aalto University, University of Eastern Finland, ...

The basic concepts underpinning time-domain reflectometry. Difference between frequency- and time-domain analysis. Some applications of TDR measurements. Time-domain reflectometry (TDR) is a technique ...

Optical methods are among the most common approaches to biosensing for plants and animals. For example, remote sensing equipment from satellites routinely use reflectance quality to determine the ...

A new technical paper titled “Interface sharpness in stacked thin film structures: a comparison of soft X-ray reflectometry and transmission electron microscopy” was published by researchers at ...

Objective: The objective of this graduate project course is to use a UAV-based system to (1) collect both direct and reflected Global Navigation Satellite System (GNSS) signals over the surface of ...

You normally use TDR (time-domain reflectometry) to measure impedance change along a signal path (Reference 1). It is also a valuable tool for measuring propagation delays. The TDR technique is ...