Semiconductor Engineering

Enhancing Silicon Reliability With In-System Test And SLM Data

A convergence of DFT techniques and the proliferation of in-silicon monitors can flag potential failures before they occur.
Machine Design

6 Ways to Make Reliability Tests More…Well, Reliable

Reliability tests are a crucial part of the manufacturing process, one that ensures your product meets the quality standards your customers expect. All the same, designing good reliability tests is ...
Business Wire

Toshiba Starts Test-Sample Shipments of a Bare Die 1200V SiC MOSFET with Low On-Resistance and High Reliability, for Use in Automotive Traction Inverters

KAWASAKI, Japan--(BUSINESS WIRE)--Toshiba Electronic Devices & Storage Corporation (“Toshiba”) has developed "X5M007E120," a bare die [1] 1200V silicon carbide (SiC) MOSFET for automotive traction ...
Semiconductor Engineering

New Challenges In IC Reliability

Experts at the Table: Semiconductor Engineering sat down to discuss reliability of chips, how it is changing, and where the new challenges are, with Steve Pateras, vice president of marketing and ...
Electronic Design

Optical Sensors: Apply Reliability Strategies to Drive Smart Component Selection

What are the key factors in optimizing mean time between failure (MTBF)? Developing the best strategy for MTBF. What to look for in MTBF test studies. For designers of engineered electronics powering ...