ZEISS Crossbeam 750 ZEISS Crossbeam 750 FIB-SEM advances live, high-resolution “see while you mill” capability, providing ...

Zeiss has unveiled the new Zeiss Crossbeam 750 focused ion beam-scanning electron microscope (FIB-SEM), optimised for ...

Atomic force microscopy (AFM) is a very popular analysis tool for 3D surface topology visualization and other measurements on a wide range of materials at nanoscales ...

The family of electron microscopy techniques have become staple methods for imaging nanoscale objects, including nanoparticles, viruses and proteins. The appeal of electron microscopy as a ...

Despite advancements, cryo-EM sample preparation remains a bottleneck, affecting structural biology and protein science through intrinsic disorder challenges.

This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...

Observations at the nanoscale can provide profound insights into materials science. Yet, the characterization of beam-sensitive and reactive materials has proven challenging. In order to address this ...

Our experienced team supports users at every step. We offer training designed to ensure that users become proficient in sample preparation, microscope use, and data collection and analysis. Users can ...

Responsive technique: Jonathan Peters using an electron microscope at Trinity College Dublin (Courtesy: Lewys Jones and Jonathan Peters/Trinity College Dublin) A new scanning transmission electron ...

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