Business Wire

ASSET’s Board Bring-Up Solution First to Validate, Test and Debug Designs Using the Intel Microarchitecture Codenamed Haswell

RICHARDSON, Texas--(BUSINESS WIRE)--With new tools for the ASSET® ScanWorks® platform for embedded instruments, design engineers can for the first time structurally verify, functionally test, analyze ...
Electronic Design

Learn ABCs Of JTAG Boundary-Scan Testing With Software Bundle

Boundry-scan testing (IEEE1149.1/JTAG) is a novel procedure for some test engineers and technicians. But ScanWorks Interconnect Development Station version 3.4 from Asset Intertech should ease their ...
EDN

Software to accelerate time-to-test for first time users of JTAG/boundary scan

Boundary-scan test and device programming vendor ASSET InterTech (Richardson, Texas) claims that the time it takes first-time and occasional users to develop a functional JTAG test, or to reach ...
Electronic Design

ScanWorks Supports Intel Silicon View Technology

June 13, 2013. With the introduction last week of Intel Silicon View Technology (Intel SVT), ASSET InterTech’s ScanWorks platform became a platform that fully supports all three aspects of the new ...