Molex, a global electronics leader and connectivity innovator, has set an industry benchmark for Test and Measurement (T&M) with the introduction of Molex Cardinal Multi-Port High-Frequency Coaxial ...

At Embedded World, Rohde & Schwarz will showcase its ever-growing range of next-generation oscilloscopes, from R&S MXO 3 to R&S MXO 5, all powered by the same next-generation MXO-EP ASIC technology ...

The “Special Report—Test Applications” in our January issue focuses on the software tools as well as logic analyzers, protocol analyzers, BERTs, phase-noise testers, spectrum analyzers, vector network ...

Keysight Technologies has introduced the Infiniium XR8 real time oscilloscopes for high speed digital validation and ...

With high speed digital designs frequently encountering analog effects, test and measurement experts Dr. Geoff Lawday, David Ireland and Greg Edlund have written a practical guide to help digital ...

The transition to HDMI 2.0 was overwhelmingly driven by the urge to support higher resolution signals, notably 4K HDR 4:4:4 with a 600-megapixel flow rate. HDMI 2.0 is furthermore built to accommodate ...

The latest buzz phrase in electronic engineering today is “signal integrity”. That is especially what the test and measurement companies want to help you achieve. And engineers everywhere are trying ...

ANSYS, Inc., (Southpointe, Pennsylvania, USA) has unveiled the version 4.0 release of SIwave software which includes new features for signal-integrity, power-integrity and electromagnetic ...

As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...

Interconnect cables play an important role in electronics testing. As high-speed signal communications continue to advance, cabling solutions will need to keep up with high-speed, multiport testing.

Experts at the Table: Semiconductor Engineering sat down to discuss the rapidly changing landscape of design for testability (DFT), focusing on the impact of advancements in fault models, high-speed ...