“This paper analyzes TCAD ESD simulation for both HBM zapping using real-world HBM ESD waveforms as stimuli and TLP testing using square wave TLP pulse trains as stimuli. It concludes that TCAD ESD ...

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

With 68% of the ASICs going through respins and 83% of the FPGA designs failing the first time around, verification poses interesting challenges. It’s also not a secret that nearly 60-70% of the cost ...

You can’t improve what you can’t measure, and when it comes to methodologies the notion of measurement becomes more difficult. Add in notions of the skills, capabilities and experience levels of ...

The title of this article may sound like the start of a Seinfeld joke from the 90s, but it’s actually a serious question. Many people do not appreciate what makes a system-on-chip (SoC) different from ...