The Eccentric plunger probe employs a patented biasing design that improves the reliability and longevity of the probe by reducing resistance and probe wear. By drilling the plunger’s spring cavity in ...

Exploiting a proven spring-probe design, the QUAD-4 test clip ensures secure, non-evasive contact for Micron TSOPII packaged ICs. It is designed to clip over surface-mounted DDR SDRAM memories in the ...

If you've ever tenuously probed an expensive IC in a surface-mount package, you'll appreciate these new test adjuncts from Emulation Technology (ET—Santa Clara, Calif.). It's rolling out test clips ...

Delray Beach, FL, March 02, 2026 (GLOBE NEWSWIRE) -- The report "Probe Pin Market by Pogo Type, Stamping Type, Spring Contact, Non-Spring Contact, Semiconductor Testing (Wafer-level Testing, and ...

Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing ...