Wafers can be inspected for large, obvious defects, or for small, subtle ones. The former is referred to as macro-inspection, while the latter is micro-inspection. These processes use different ...

Experts at the Table: Semiconductor Engineering sat down to talk about how to inspect and measure smaller features across large areas in advanced packaging, with Frank Chen, director of applications ...

MILPITAS, Calif.--(BUSINESS WIRE)--Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control metrology and inspection systems, today announced that its SPARK-API macro ...