Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

With the move to advanced process technologies, concerns over device power once largely limited to specialized markets have escalated rapidly among mainstream designers. More semiconductor companies ...

In too many instances, test is still an afterthought of design, which slows the development process and lengthens time to market. Dr. James Truchard of National Instruments discusses the benefits of ...

Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and ...

Electronics design and testing were once two distinct functions where an electronic design was breadboarded and populated before testing. Problems that emerged during testing may have forced some time ...

In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...

A higher form of simulation, digital twins collect data to create accurate simulations that display the operation, potential failures, and possible future maintenance issues in manufacturing equipment ...

Electronics testing has always been a critical yet behind-the-scenes process, ensuring that products meet performance and quality standards before reaching the market. However, as technology advances, ...