Development teams that benefit most from high-resolution additive manufacturing are using it to ask better questions earlier ...

Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...

Driven by the expansion of wireless and power-efficient devices and by the marketing requirement to deliver 'green' electronic systems, designers are increasingly employing low power design techniques ...

Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...

Two companies have joined forces to optimize quality, integrity, post-programming validation, and cost for embedded test of reprogrammable logic cores. The increasing complexity of system-on-a-chip ...

Compact, modular system with integrated multi-test capability and up to 20-core parallel testing for high-volume efficiency Keysight Technologies, Inc. (NYSE: KEYS) introduces the next generation of ...