Conor has been staunchly in favor of Android since graduating to a smartphone from his hot pink Motorola RAZR. In fact, he'll gladly ruin a friendly dinner in service of lambasting Apple devices to ...
With a so-called cryo plasma-FIB (Plasma Focused Ion Beam) scanning electron microscope with nanomanipulator, Goethe University in Frankfurt (Germany) is expanding its research infrastructure with a ...
The biggest chains in America are using facial recognition technology to try to stop shoplifting. But most customers are unaware their faces are being scanned while they shop. Facial recognition isn’t ...
A new technical paper titled “Recent Progress in Structural Integrity Evaluation of Microelectronic Packaging Using Scanning Acoustic Microscopy (SAM): A Review” was published by researchers at ...
A new dual-light microscope lets researchers observe micro- and nanoscale activity inside living cells without using dyes. The system captures both detailed structures and tiny moving particles at ...
(a) A scanning electron microscope (SEM) image of the nanoneedle probe used for the measurements. (b) Elasticity map of a 1 µm × 1 µm area on the nuclear surface, showing the change in elasticity ...
Digital driver’s licenses — now being built in many states — have a big problem that almost nobody is addressing: the likelihood that once they make it very frictionless to share our ID, we are likely ...
“Nanowonder: Images from the Microscopic World” is a new exhibit on display in the Rozsa Art Galleries featuring photographs taken by a high-powered electron scanning microscope. × Butterfly wings, ...
The video cassette tape was really the first successful home video format; discs just couldn’t compete back in the early days. That’s not to say nobody tried, however, with RCA’s VideoDisc a valiant ...
The DeepInMiniMicroscope developed by UC Davis electrical engineering professor Weijian Yang combines optical technology and machine learning to create a device that can take high-resolution ...
Abstract: The scanning capacitance microscope technique described is based on a dC/dV measurement at the metal-semiconductor junction between a metallic probe and a sample. The probe forms part of a ...
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